{"id":4930,"date":"2021-06-02T10:55:34","date_gmt":"2021-06-02T03:55:34","guid":{"rendered":"https:\/\/dbm.com.vn\/product\/4930\/"},"modified":"2021-06-02T13:17:22","modified_gmt":"2021-06-02T06:17:22","slug":"test-electronic-for-burn-in-system","status":"publish","type":"product","link":"https:\/\/dbm.com.vn\/en\/product\/test-electronic-for-burn-in-system\/","title":{"rendered":"Test Electronic for Burn-in System"},"content":{"rendered":"<p class=\"Normal\"><strong><span lang=\"EN-GB\">UBTS \/ VBTS \/ VBTS-M Series<\/span><\/strong><\/p>\n<p class=\"Normal\"><span lang=\"EN-GB\">Starting with dedicated BI system for Memories, Digital, Automotive and Mixed-Signal devices, the technological evolution of devices dictated from the market and the demand of increasing the test capacity have brought EDA Industries to design a powerful and innovative test system: the UBTS &#8211; Universal Burn-in Test System.<\/span><\/p>\n<p class=\"Normal\"><span lang=\"EN-GB\">This series is based on reprogrammable\u00a0Microprocessor and FPGA firmwares, so that the same HW platform can be SW reconfigured as a Digital, Mixed-Signal, Memory tester.<br \/>\nMoreover, it allows a continuous development of new features and upgrades, that can be easily released\/updated just by deploying a FW release.<\/span><\/p>\n<p class=\"Normal\"><span lang=\"EN-GB\">EDA has continuously developed its main Burn-In systems introducing many features and improving roboustness in order to offer a state-of-art Test Electronic for the Burn-In.<br \/>\n<\/span><span lang=\"EN-GB\">Driving the evolution since UBTS,\u00a0through\u00a0VBTS, and finally to its latest modular version: the VBTS-M.<\/span><\/p>\n<p class=\"Normal\"><strong><span lang=\"EN-GB\">Main Features:<\/span><\/strong><\/p>\n<ul>\n<li><span lang=\"EN-GB\">advanced\u00a0<strong>modularity<\/strong>\u00a0for an easy system configuration and improved maintenability<\/span><\/li>\n<li><span lang=\"EN-GB\">up to\u00a0<strong>256 I\/O<\/strong>\u00a0Bidirectional lines<\/span><\/li>\n<li><span lang=\"EN-GB\">up to\u00a0<strong>48 Stimulation<\/strong>\u00a0lines<\/span><\/li>\n<li><span lang=\"EN-GB\">additional<strong>\u00a032 Input<\/strong>\u00a0lines<\/span><\/li>\n<li><span lang=\"EN-GB\">up to\u00a0<strong>6 DUTs Power Supply Units<\/strong>, powering each BIB with up to 600W and 104A.<\/span><\/li>\n<li><span lang=\"EN-GB\"><strong>4 VREF<\/strong>\u00a0for DUT Voltage References<\/span><\/li>\n<li><span lang=\"EN-GB\"><strong>32 EXT<\/strong>\u00a0lines for optional boards, ensuring function expandability and customization.<\/span><\/li>\n<\/ul>\n<p><strong><span lang=\"EN-GB\">Options:<\/span><\/strong><\/p>\n<ul>\n<li><span lang=\"EN-GB\"><strong>Analog Waveform Generator board<\/strong>, adding 4 differential Analog channels.\u00a0<\/span><\/li>\n<li><span lang=\"EN-GB\"><strong>Analog Monitoring board<\/strong>, replacing 128 IOs with 96 Analog Input lines, monitored by windows comparation.\u00a0<\/span><\/li>\n<li><span lang=\"EN-GB\"><strong>High Power option<\/strong>, bringing additional 1<\/span>6 High Power Supplies dedicated for DUTs&#8217; supply, powering each BIB with more than 2KW and 640A.<\/li>\n<li><span lang=\"EN-GB\"><strong>DUT TEMP MON\u00a0option<\/strong>\u00a0for Single Device Temperature Monitoring, fully embedded in the EDA system.<\/span><\/li>\n<li><span lang=\"EN-GB\"><strong>Single-Device Temperature Control option<\/strong>, fully embedded in the EDA system.<\/span><\/li>\n<li><span lang=\"EN-GB\"><strong>Parametric Measurement option<\/strong>, adding PMU capability to every line and power supply.<\/span><\/li>\n<li><span lang=\"EN-GB\"><strong>Enhanced option for advanced Quality and Reliability Test<\/strong>, bringing arbitrary waveform generation, advanced analog monitoring, and a 5KW external power supply control with 24 EXT-PSU lines for independent voltage and current monitoring.<\/span><\/li>\n<li><span lang=\"EN-GB\"><strong>Enhanced option for Power\/Load architecture<\/strong>, bringing an additional 5\/10KW External Power Supply to dest devices that requires external fixed or programmable load.<\/span><\/li>\n<\/ul>\n<p class=\"Normal\"><strong>Compatibility:<\/strong><\/p>\n<ul>\n<li>to replace the existing systems with the new platform while keeping in use the existing BIBs\u00a0VBTS-M Series ensures the compatibility with\n<ul>\n<li>the\u00a0<strong>other\u00a0EDA BIB standards: DBTS,\u00a0HBTS,\u00a0MBTSII,\u00a0MBTSIII,\u00a0ARES<\/strong><\/li>\n<li>many\u00a0<strong>non-EDA BIB standard: Standard-A, Standard-C, AHER-MAX, \u00a0ART-200,\u00a0UAMT,\u00a0ADBV1,\u00a0EJ18\/EJ22,\u00a0ENDZONE, CRITERIA.<\/strong><\/li>\n<\/ul>\n<\/li>\n<li>&#8230; ask us to make\u00a0<strong>your BIB standard<\/strong> compatibile with the state-of-the-art EDA Burn-In platform&#8230;<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p><span lang=\"EN-GB\">Starting with dedicated BI system for Memories, Digital, Automotive and Mixed-Signal devices<\/span><\/p>\n","protected":false},"featured_media":4926,"template":"","meta":[],"product_cat":[1179,29,72],"product_tag":[1187,1188,1189,1190],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/dbm.com.vn\/en\/wp-json\/wp\/v2\/product\/4930"}],"collection":[{"href":"https:\/\/dbm.com.vn\/en\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/dbm.com.vn\/en\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/dbm.com.vn\/en\/wp-json\/wp\/v2\/media\/4926"}],"wp:attachment":[{"href":"https:\/\/dbm.com.vn\/en\/wp-json\/wp\/v2\/media?parent=4930"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/dbm.com.vn\/en\/wp-json\/wp\/v2\/product_cat?post=4930"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/dbm.com.vn\/en\/wp-json\/wp\/v2\/product_tag?post=4930"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}